Comprehensive Radiation Effects Testing

Total Ionizing Dose (TID) testing evaluates the long-term effects of cumulative radiation exposure on electronic components, critical for space, aerospace, and defense systems. TID represents the absorbed energy from ionizing radiation (primarily electrons and protons in space) that gradually degrades semiconductor device performance, potentially leading to parametric shifts or failure.

Why TID Testing Matters

• Space Missions: Ensures components can withstand radiation from solar and trapped particle environments over the mission’s duration.
   
• Military & Defense Systems: Required for systems operating in high-altitude or nuclear environments.
   
• Reliability Assurance: TID testing verifies that components meet design specifications after prolonged radiation exposure, reducing mission risk.
   

What We Test

• Radiation Dose Levels: Standard dose ranges include 20, 30, 50, 100, and up to 300 krad(Si), depending on application class (SEP, QMLP, QMLV).
   
• Dose Rate Conditions:
   
  • High Dose Rate (HDR): 50–300 rad/sec (typical for CMOS)
     
  • Low Dose Rate (LDR): ≤10 mrad/sec (critical for Bipolar devices)
     
• Device Types: Plastic and ceramic-packaged devices across multiple technologies (CMOS, BiCMOS, Bipolar)
   

Our Process

• Board Design: Custom socketed or EVM-based test boards ensure accurate exposure and measurement.
   
• Facility Coordination: Testing at certified gamma facilities (e.g., using Co-60 HDR GammaCell systems).
   
• Post-Test Analysis: We evaluate degradation trends, parametric shifts, and identify failure mechanisms, delivering data-driven reports tailored to your program needs.
   

Packaging Considerations

• Ceramic packages (QMLV/QMLQ) and plastic packages (QMLP, SEP) tested under appropriate dose rates.
   
• All testing aligns with JEDEC and MIL standards to meet program requirements for reliability and qualification.