Comprehensive Radiation Effects Testing

Single Event Effects (SEE) testing evaluates how electronic components respond to a single high-energy particle strike,  a critical factor in the design and qualification of space and defense systems. In the space environment, heavy ions and protons can cause immediate, non-cumulative disruptions in device functionality.

Why SEE Testing Matters

• Space Reliability: Ensures electronics can survive instantaneous failures caused by cosmic rays or solar particles.
   
• Mission Assurance: Identifies potential latch-up, logic upsets, or transient responses that could compromise system safety.
   
• Defense Readiness: Essential for radiation assurance in missile guidance, secure comms, and airborne platforms.
   

SEE Test Objectives

• Characterize susceptibility to latch-up, bit upsets, transients, and other single-event responses.
   
• Determine performance across radiation-tolerant and radiation-hardened device classes (e.g., SEP, QMLP, QMLV).
   
• Evaluate behavior across multiple technologies: CMOS, BiCMOS, and Bipolar.
   

What We Deliver

• Tailored Test Campaigns: Configured to your mission profile, component type, and risk level.
   
• Facility Coordination: Testing conducted at certified heavy ion beam facilities with proven track records.
   
• Detailed Results & Analysis: Cross-section curves, upper-bound failure rates, and risk summaries.
   
• Mitigation Recommendations: When applicable, we provide design or architectural guidance (e.g., TMR, ECC).